Search results for "Burst noise"
showing 5 items of 5 documents
On the determination of device noise and gain parameters
1979
The least-squares fitting of measured noise figures and gains versus input termination admittance is an established procedure to determine linear two-port noise and gain parameters. Unfortunately, the method is liable to the serious inconvenience of yielding often erroneous results or even results without physical meaning. Some criteria are suggested which allow the carrying out of measurements in such a manner as to safely avoid the above drawbacks.
Stochastic resonance in a tunnel diode in the presence of white or coloured noise
1995
We study the signal-to-noise ratio, signal and noise output levels in a fast bistable electronic system: a tunnel diode. We observe stochastic resonance when the system is driven by a sum of a small periodic signal and noise. The phenomenon is investigated for values of the driving frequency as high as 10 kHz. This is the highest frequency value used in SR experiments until now. In the presence of «white noise», we observe a nonmonotonic behavior characterized by a sharp dip in the output noise level measured at 100Hz and 1 kHz. A similar behavior is predicated by recent theories. We also present preliminary experimental results of SR in the presence of an Ornstein-Uhlenbeck noise. For the …
On the noise resistance of field-effect transistors at microwave frequencies
2001
This paper presents a survey on the topical aspects of the noise resistance in field-effect transistors (FET) at microwave frequencies. Such noise parameter represents the sensitivity of the device noise figure to the departure from the minimum noise condition and is therefore important in all low-noise applications. The performance of the noise resistance in FETs has been reviewed since the first noise modeling analysis of short-gate devices were presented in the early '70s. The authors also comment and compare their own results on this subject as obtained by extensive experimental activity in the field of noisy device characterization vs. frequency, bias and temperature conditions.
Effect of the non-gaussianity on the measurement error for the filtered 1/f noise intensity
1999
To study the nature of the 1/f noise phenomenon in conductors, we seek a tool for testing different hypotheses of 1/f noise origin. The method analyzing the noise intensity at the output of a bandpass filter is discussed for the case of non-Gaussian processes. Data on measurement error are presented for the 1/f noise intensity in GaAs films and the Gaussian white noise emulated by a computer. A numerical model of 1/f noise as the superposition of telegraph random processes has been created. This method requires further improvement to check the noise for stationarity. Some ideas of how to do that are proposed.
Noise effect in a FitzHugh-Nagumo circuit driven by a bichromatic signal
2013
We analyze the response of a nonlinear circuit exactly ruled by the FitzHugh-Nagumo equations. This circuit is submitted to a bichromatic signal including a high frequency and a low frequency. In absence of noise, we show that for an appropriate amplitude of the high frequency driving, the response of the circuit estimated at the low frequency can be optimized via the phenomenon of vibrational resonance. Next, we show that under certain conditions, noise can contribute to the effect of vibrational resonance. Colored noise is also considered. Our experimental results are confirmed by a numerical analysis.